WEE TEST SOCKET
The most cost-effective ultra high performance test socket in the testing field now.
STAMPED SPRING PROBE
High performance & cost effective with stamping process.
Enabling small diameter for 0.15mm fine pitch.
Diamond like carbon material.
Reduction of Sn transfer.
High stability contact resistance.
High performance test socket, rolling contact design.
Self–cleaning wipe actions create a higher first yield with lighter pad abrasion.
Testing Logic IC handler.
Smart Motion Control robot control technology enables fast movement with low vibration when transferring semiconductors.
The Griffin III is superior cost-effective solution for mass production, engineering and failure analysis test applications.